飞纳Phenom
Classification: 飞纳Phenom
- Product Description
- Bottom details
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Optical microscope: magnification 20
filament material: 1,500 hours CeB 6
filament acceleration voltage: 5 kV
electron microscope magnification: 65,000
resolution: better than 25 nm
vacuumizing time: less than 15 seconds
detector: backscattered electron detector.
Keywords: chip frame processing capability system
Product Consulting
DIVISIA · Semiconductor Solution Provider
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Room 618, Building 3, Biyun International, 277 Zheqiao Road, Pudong New Area, Shanghai
Tel: 021-51923363-605
Email: divisia-sales@divisia.com.cn
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Shanghai DIVISIA Electronic Co., Limited
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